| CPC H10B 12/485 (2023.02) [H10B 12/315 (2023.02); H10B 12/34 (2023.02)] | 13 Claims |

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1. A method for forming a bit line contact structure, comprising:
successively disposing a first mask layer, a second mask layer, and a photoresist on a surface of a substrate, on which a plurality of word lines and a protection layer are provided, and patterning the photoresist to obtain a patterned photoresist;
successively etching the second mask layer and the first mask layer by utilizing the patterned photoresist, so as to form a first opening penetrating the first mask layer and the second mask layer;
disposing a sacrificial layer on a surface of the second mask layer, wherein the sacrificial layer covers sidewalls and a bottom wall of the first opening, so as to form a second opening having an opening width smaller than that of the first opening;
etching a surface of the protection layer to form a third opening corresponding to the second opening by utilizing the second opening, and meanwhile removing the sacrificial layer to expose the first opening; and
etching through the protection layer by utilizing the first opening and the third opening to form a bit line contact hole at the surface of the substrate, wherein the bit line contact hole is configured to form a bit line contact structure, and the bit line contact hole comprises a first hole portion and a second hole portion, the first hole portion opens at the surface of the protection layer, a hole diameter of the second hole portion is smaller than that of the first hole portion, and the second hole portion opens at a bottom wall of the first hole portion.
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