| CPC H01L 29/0843 (2013.01) [H01L 29/0649 (2013.01); H01L 29/785 (2013.01); H01L 23/528 (2013.01)] | 20 Claims |

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1. A semiconductor structure, comprising:
a first source/drain (S/D) feature having a first side and a second side;
a channel layer connected to the first S/D feature between the first side and the second side;
a gate structure engaging the channel layer;
an interconnect structure adjacent the first side of the first S/D feature;
a backside power rail adjacent a second side of the first S/D feature;
a conductive feature extending from the backside power rail to the second side of the first S/D feature; and
a liner layer along sides of the conductive feature, the liner layer having a terminal end covered by the conductive feature.
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