| CPC G01R 1/0441 (2013.01) [G01R 1/0416 (2013.01); G01R 1/0491 (2013.01); G01R 1/06705 (2013.01); G01R 1/07307 (2013.01); G01R 31/2601 (2013.01); G01R 31/2855 (2013.01); G01R 31/2863 (2013.01); G01R 31/2886 (2013.01); G01R 31/2887 (2013.01)] | 16 Claims |

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1. A method of testing an integrated circuit of a device, comprising:
holding the device against a surface of a holder;
moving a contactor board assembly vertically relative to the holder to bring terminals of a contactor support structure of the contactor board assembly into contact with contacts on the device;
providing signals through the terminals and contacts to the integrated circuit, wherein the contactor support structure includes a contactor substrate connected to a distribution board substrate with at least a first connecting arrangement, the first connecting arrangement including first and second connecting pieces with complementary interengaging formations that allow for movement of the contactor substrate relative to the distribution board substrate by sliding horizontally relative to each other in a first radial direction and horizontally restricts movement of the contactor substrate relative to the distribution board substrate in a first tangential direction transverse to the first radial direction; and
moving the contactor board assembly vertically relative to the holder to disengage the terminals of the contactor support structure from the contacts on the device.
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