| CPC G01Q 20/02 (2013.01) | 20 Claims |

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1. An atomic force microscope based interferometer, comprising a light source, for emitting a light beam;
a splitting optical interface, arranged to split the light beam into a signal light beam and a reference light beam;
an AFM cantilever;
an electrically controlled birefringent liquid crystal device, which is electrically operable to modulate an optical path difference between the signal light beam and the reference light beam during a calibration of the interferometer response and electrically deactivated during a measurement of a movement of the cantilever;
optics for guiding the signal light beam and the reference light beam to impinge on two locations in the vicinity of the AFM cantilever, and to guide light reflecting off the said locations; and
a detector that in use receives the guided light reflecting off the said locations and that operates to determine differences in optical path length between the signal light beam and reference light beam to determine information about the movement of the cantilever.
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