US 12,295,228 B2
Display substrate, manufacturing method thereof, and display device
Bo Zhang, Beijing (CN); Rong Wang, Beijing (CN); and Yulong Wei, Beijing (CN)
Assigned to Chegdu BOE Optoelectronics Technology Co., Ltd., Sichuan (CN); and BOE TECHNOLOGY GROUP CO., LTD., Beijing (CN)
Filed by CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Sichuan (CN); and BOE TECHNOLOGY GROUP CO., LTD., Beijing (CN)
Filed on Mar. 29, 2024, as Appl. No. 18/621,323.
Application 18/621,323 is a continuation of application No. 17/436,149, granted, now 12,200,986, previously published as PCT/CN2020/079005, filed on Mar. 12, 2020.
Prior Publication US 2024/0315098 A1, Sep. 19, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. H10K 59/131 (2023.01); G01R 31/28 (2006.01); H01L 23/00 (2006.01); H10K 59/12 (2023.01); H10K 71/00 (2023.01)
CPC H10K 59/131 (2023.02) [G01R 31/2884 (2013.01); H10K 71/00 (2023.02); H01L 24/06 (2013.01); H01L 2224/06155 (2013.01); H10K 59/1201 (2023.02)] 20 Claims
OG exemplary drawing
 
1. A display substrate comprising:
a base substrate, comprising a display zone and a peripheral zone surrounding the display zone, the peripheral zone comprising a test bonding zone located at a side of the display zone;
a plurality of sub-pixel units, located within the display zone and located at a side of the base substrate,
a plurality of data lines, located within the display zone and electrically connected to the plurality of sub-pixel units, and configured to provide data signals to the plurality of sub-pixel units,
a plurality of connection lines, located within the peripheral zone and electrically connected to the plurality of data lines;
a test unit, located within the peripheral zone and electrically connected to the plurality of connection lines;
a plurality of first leads, located within the peripheral zone and connected to the test unit, wherein an extension direction of the plurality of connection lines intersects with an extension direction of the plurality of first leads;
a plurality of test contact pads, located within the test bonding zone and located at a side of the base substrate, wherein a part of the plurality of test contact pads are connected to the plurality of first leads, and the plurality of test contact pads are configured to provide a test signal to the display zone through the test unit during a lighting test stage so as to detect display characteristics of the display zone;
a first peripheral-zone insulating layer, located within the test bonding zone and configured to expose a portion of the test contact pad and cover at least a portion of a periphery of the test contact pad;
an auxiliary electrode layer, comprising a plurality of first relay electrode patterns located within the test bonding zone, wherein the plurality of first relay electrode patterns are located at a side of the first peripheral-zone insulating layer and the plurality of test contact pads away from the base substrate,
the display substrate further comprising:
a second peripheral-zone insulating layer, located within the test bonding zone and located between the first peripheral-zone insulating layer, the plurality of test contact pads and the plurality of first relay electrode patterns to cover the first peripheral-zone insulating layer and at least a portion of a periphery of the plurality of test contact pads; wherein
the first peripheral-zone insulating layer exposes a portion of a surface of the test contact pad facing away from the base substrate through a first opening, and covers at least a portion of a periphery of the test contact pad;
the second peripheral-zone insulating layer has a plurality of first test-contact-pad via-holes, the first test-contact-pad via-hole has a second opening, the second peripheral-zone insulating layer exposes a portion of a surface of the test contact pad facing away from the base substrate through the second opening, the second opening is communicated with the first opening, the second opening is smaller than the first opening and is located within a range of the first opening, at least a portion of the second peripheral-zone insulating layer that covers the test contact pad is located within the first opening and surrounds the second opening, the plurality of first relay electrode patterns are electrically connected to the plurality of test contact pads through the first opening and the second opening, respectively.