CPC H01L 29/872 (2013.01) [H01L 29/0619 (2013.01); H01L 29/47 (2013.01)] | 20 Claims |
1. A semiconductor device, comprising:
a semiconductor layer over a substrate; and
a diode, including:
a guard ring in the semiconductor layer, the guard ring having a first conductivity type, the guard ring including a first guard ring segment and a second guard ring segment;
a barrier region in the semiconductor layer, the barrier region having a second conductivity type, opposite from the first conductivity type, the barrier region extending between and touching the first guard ring segment and the second guard ring segment;
a well region having the second conductivity type surrounded by the guard ring;
a drift region having the second conductivity type in the semiconductor layer and extending from the barrier region toward the well region; and
a metal containing layer forming a Schottky barrier with the barrier region.
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