CPC H01L 21/3086 (2013.01) [H01L 21/3065 (2013.01)] | 10 Claims |
1. A structure manufacturing method comprising:
a mask formation step of forming a mask that has an opening pattern on a surface of a substrate;
a first etching step of etching the surface of the substrate with the mask to form a recessed portion corresponding to the opening pattern of the mask on the surface of the substrate;
a thin film formation step of forming a thin film including aluminum at least on a bottom surface of the recessed portion in a state where the mask remains;
a hot water treatment step of treating the thin film including aluminum with hot water to change the thin film into a fine recessed and projected layer including alumina hydrate smaller than the recessed portion;
a second etching step of etching the bottom surface of the recessed portion, on which the fine recessed and projected layer is formed, in a state where the mask remains to form a fine recessed and projected structure on the bottom surface of the recessed portion; and
a mask removal step of removing the mask and the fine recessed and projected structure, which remains after the second etching step.
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