CPC H01L 21/268 (2013.01) [B23K 26/50 (2015.10); B23K 2103/56 (2018.08)] | 8 Claims |
1. A diamond wafer dividing method used when a diamond wafer having a front surface along a {100} plane is divided at planned dividing lines along a <110> direction, the dividing method comprising:
a first modified layer forming step of forming a first modified layer at a linear first region along the planned dividing line, inside the diamond wafer by executing irradiation with a laser beam with such a wavelength as to be transmitted through the diamond wafer, in such a manner that the laser beam is focused on the first region;
a second modified layer forming step of forming a second modified layer at a linear second region that is shifted from the first region in a width direction which is parallel to the front surface and which is perpendicular to the first region and in a thickness direction perpendicular to the front surface and that is inside the diamond wafer, by executing irradiation with the laser beam with such a wavelength as to be transmitted through the diamond wafer, in such a manner that the laser beam is focused on the second region; and
a dividing step of dividing the diamond wafer along the planned dividing lines by giving a force to the diamond wafer in which the first modified layer and the second modified layer are formed.
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