US 12,293,909 B2
Systems and methods for analyzing samples
Joshua Wiley, Auburn, CA (US); Paul Nurmi, Gardnerville, NV (US); and Qiangwei Xia, Brooklyn, NY (US)
Assigned to CMP Scientific Corp, Brooklyn, NY (US)
Filed by CMP Scientific Corp., Brooklyn, NY (US)
Filed on Aug. 2, 2022, as Appl. No. 17/816,734.
Prior Publication US 2024/0047188 A1, Feb. 8, 2024
Int. Cl. H01J 49/06 (2006.01); H01J 49/00 (2006.01); H01J 49/26 (2006.01)
CPC H01J 49/063 (2013.01) [H01J 49/0031 (2013.01); H01J 49/26 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A mass spectrometer, the mass spectrometer comprising:
a source configured to output one or more ions;
a plurality of chambers having different pressures, the plurality of chambers comprising at least a first chamber having a first pressure that is less than atmospheric pressure and a second chamber having a second pressure that is less than the first pressure;
a detector configured to detect the one or more ions; and
a particle guide, the particle guide comprising:
a conduit through which the one or more ions may travel an entire length of the particle guide, the conduit being disposed within at least the first chamber and the second chamber; and
a housing surrounding the conduit, the housing comprising at least:
a first open section comprising a first vent, the first vent defining a passage between the first chamber and the conduit;
a second open section comprising a second vent, the second vent defining a passage between the second chamber and the conduit; and
a closed section disposed between the first open section and the second open section, at least part of the closed section being disposed at a juncture between the first chamber and the second chamber;
wherein the one or more ions are configured to travel from the source, through at least the first chamber, the second chamber, and the particle guide, and to the detector.