US 12,293,797 B2
Apparatus and methods for smart verify with adaptive voltage offset
Longju Liu, Fremont, CA (US); Sarath Puthenthermadam, San Jose, CA (US); and Jiahui Yuan, Fremont, CA (US)
Assigned to Sandisk Technologies, Inc., Milpitas, CA (US)
Filed by SanDisk Technologies LLC, Addison, TX (US)
Filed on Jul. 19, 2023, as Appl. No. 18/355,343.
Claims priority of provisional application 63/433,495, filed on Dec. 19, 2022.
Prior Publication US 2024/0203512 A1, Jun. 20, 2024
Int. Cl. G11C 16/10 (2006.01); G11C 16/34 (2006.01)
CPC G11C 16/3459 (2013.01) [G11C 16/10 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a control circuit coupled to a plurality of non-volatile memory cells, the control circuit configured to:
perform a program-verify iteration on a first set of the non-volatile memory cells in a plurality of program loops;
determine that the first set of the non-volatile memory cells passes verification to a particular programmed state in a first number of program loops;
determine a first voltage based on the first number of program loops;
add an adaptive voltage offset to the first voltage to obtain a second voltage; and
program a second set of the non-volatile memory cells in a plurality of program loops using the second voltage,
wherein the adaptive voltage offset varies as a function of temperature.