US 12,293,510 B2
Inspection system, inspection apparatus, method of controlling the same, and storage medium
Kenichirou Haruta, Chiba (JP)
Assigned to Canon Kabushiki Kaisha, Tokyo (JP)
Filed by CANON KABUSHIKI KAISHA, Tokyo (JP)
Filed on Aug. 24, 2022, as Appl. No. 17/821,991.
Claims priority of application No. 2021-140267 (JP), filed on Aug. 30, 2021.
Prior Publication US 2023/0066402 A1, Mar. 2, 2023
Int. Cl. G06T 7/00 (2017.01); H04N 1/00 (2006.01)
CPC G06T 7/001 (2013.01) [H04N 1/00718 (2013.01); G06T 2207/30144 (2013.01)] 17 Claims
OG exemplary drawing
 
1. An inspection apparatus comprising:
one or more controllers including one or more processors and one or more memories, the one or more controllers being configured to:
obtain a scanned image by reading a printed product;
calculate a weighting factor of a weighting filter based on differences between a value of a pixel of interest in a reference image used in creation of the printed product and values of peripheral pixels of the pixel of interest;
perform filter processing by using the weighting filter having the weighting factor, with respect to a pixel of interest in the scanned image, which corresponds to the pixel of interest in the reference image, thereby shifting the pixel of interest in the scanned image, and create an inspection target image by calculating the weighting factor and performing the filter processing with respect to the shifted pixel of interest; and
inspect quality of the printed product by collating the inspection target image with the reference image.