US 12,293,506 B2
Method to locate defects in e-coat
Jacob Nathaniel Allen, Shelby Township, MI (US)
Assigned to INOVISION SOFTWARE SOLUTIONS, INC., Chesterfield, MI (US)
Filed by INOVISION SOFTWARE SOLUTIONS, INC., Chesterfield, MI (US)
Filed on Jul. 20, 2022, as Appl. No. 17/869,147.
Claims priority of provisional application 63/223,676, filed on Jul. 20, 2021.
Prior Publication US 2023/0025165 A1, Jan. 26, 2023
Int. Cl. G06T 7/80 (2017.01); B05D 7/14 (2006.01); C25D 13/12 (2006.01); G06T 7/00 (2017.01); G06T 7/90 (2017.01)
CPC G06T 7/0004 (2013.01) [B05D 7/142 (2013.01); C25D 13/12 (2013.01); G06T 7/80 (2017.01); G06T 7/90 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10036 (2013.01); G06T 2207/20182 (2013.01); G06T 2207/30156 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method of locating a defect in an e-coat on a surface, comprising:
acquiring an image of the surface;
applying a correction coefficient to the image to form an adjusted image, the correction coefficient relating pixel values of the image to a calibration value;
separating a spectral component from the adjusted image each of the plurality of pixels;
modifying the spectral component to create a modified spectral component, the modifying including a block average determination;
comparing the spectral component with the modified spectral component to form a difference image;
dilating and eroding the difference image;
identifying a region of interest from a one or more image regions using a blob detection threshold value to locate the defect;
classifying the defect; and
performing one of:
repairing the defect; and
changing a parameter of an e-coating process to form a modified e-coating process and coating another surface using the modified e-coating process.