US 12,293,099 B2
Open block family duration limited by time and temperature
Michael Sheperek, Longmont, CO (US); Larry J. Koudele, Erie, CO (US); Bruce A. Liikanen, Berthoud, CO (US); Steven Michael Kientz, Westminster, CO (US); and Kishore Kumar Muchherla, Fremont, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Jan. 18, 2023, as Appl. No. 18/098,439.
Application 18/098,439 is a continuation of application No. 16/947,819, filed on Aug. 19, 2020, granted, now 11,573,720.
Prior Publication US 2023/0153003 A1, May 18, 2023
Int. Cl. G06F 3/06 (2006.01); G01K 3/04 (2006.01); G06F 1/3228 (2019.01); G06F 1/324 (2019.01)
CPC G06F 3/064 (2013.01) [G01K 3/04 (2013.01); G06F 1/3228 (2013.01); G06F 1/324 (2013.01); G06F 3/0604 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device; and
a processing device, operatively coupled to the memory device, the processing device configured to perform operations, comprising:
initializing a block family associated with the memory device;
initializing a timer at initialization of the block family;
associating pages of the memory device, as the pages are programmed, with the block family while the block family is open;
storing, in non-volatile memory of the memory device, a value of the timer before powering down the system while the block family is open;
detecting a power on of the system;
measuring a data state metric associated with memory cells of the pages, wherein the data state metric reflects one of a lower tail location or an upper tail location of a voltage distribution;
estimating a time after program value of the pages based on comparing a level of the data state metric to a temporal voltage shift function;
incrementing the value of the timer, restored from the non-volatile memory, based on the time after program value; and
closing the block family based on the incremented value of the timer.