US 12,292,468 B2
Inspection system and inspection method of bare circuit board
Chun-Hsien Chien, Taoyuan (TW); Hsin-Hung Lee, Taoyuan (TW); Hsuan-Yu Lai, Taoyuan (TW); and Yu-Chung Hsieh, Taoyuan (TW)
Assigned to Unimicron Technology Corp., Taoyuan (TW)
Filed by Unimicron Technology Corp., Taoyuan (TW)
Filed on May 10, 2023, as Appl. No. 18/315,474.
Claims priority of application No. 112109411 (TW), filed on Mar. 14, 2023.
Prior Publication US 2024/0310428 A1, Sep. 19, 2024
Int. Cl. G01R 31/28 (2006.01)
CPC G01R 31/2805 (2013.01) [G01R 31/2808 (2013.01)] 16 Claims
OG exemplary drawing
 
1. An inspection system used for inspecting a bare circuit board, wherein the bare circuit board comprises a chip pad and an antenna, the chip pad is electrically connected to the antenna, and the inspection system comprises:
an adapter board comprising a chip and a contact structure, wherein the chip is electrically connected to the contact structure, and the contact structure touches the chip pad so that the chip is electrically connected to the chip pad;
a test device comprising a transceiver antenna, wherein the test device and the bare circuit board separate; and
a measuring device electrically connected to one of the chip and the transceiver antenna,
wherein when the chip generates a chip test signal, the chip test signal is transmitted to the bare circuit board via the contact structure and radiated from the antenna, wherein the transceiver antenna outputs an electrical test signal to the measuring device after receiving the chip test signal, wherein the measuring device measures a property parameter of the antenna according to the electrical test signal,
wherein when the transceiver antenna radiates an antenna test signal, the bare circuit board receives the antenna test signal by the antenna, and the antenna outputs and transmits an electrical signal to the chip via the contact structure, wherein the chip outputs a demodulated test signal to the measuring device after receiving the electrical signal, wherein the measuring device measures the property parameter of the antenna according to the demodulated test signal.