US 12,292,400 B2
Non-invasive substance analysis apparatus
Yuki Tsuda, Tokyo (JP); Shusaku Hayashi, Tokyo (JP); and Koichi Akiyama, Tokyo (JP)
Assigned to MITSUBISHI ELECTRIC CORPORATION, Tokyo (JP)
Appl. No. 18/834,630
Filed by Mitsubishi Electric Corporation, Tokyo (JP)
PCT Filed Feb. 17, 2022, PCT No. PCT/JP2022/006342
§ 371(c)(1), (2) Date Jul. 31, 2024,
PCT Pub. No. WO2023/157164, PCT Pub. Date Aug. 24, 2023.
Prior Publication US 2024/0418663 A1, Dec. 19, 2024
Int. Cl. G01N 25/20 (2006.01)
CPC G01N 25/20 (2013.01) 9 Claims
OG exemplary drawing
 
1. A non-invasive substance analysis apparatus comprising:
a sample support plate having a first main surface including a sample placement region, and a second main surface opposite to the first main surface;
an excitation light source to emit excitation light toward a sample placed on the sample placement region;
at least one temperature sensor provided on the first main surface; and
a reference temperature sensor provided on the first main surface, wherein
a through hole extending from the sample placement region to the second main surface is provided in the sample support plate,
the excitation light is applied to the sample through the through hole,
the reference temperature sensor is provided in the sample placement region and comes into contact with the sample,
in a plan view of the first main surface, a second distance between the reference temperature sensor and the through hole is ten times or more as long as a first distance between the at least one temperature sensor and the through hole, and
the apparatus further comprises processing circuitry configured as a substance analysis unit to perform substance analysis on the sample based on detection values of the at least one temperature sensor and the reference temperature sensor.