US 12,292,397 B2
X-ray fluorescence analyzer
Yuji Morihisa, Kyoto (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP)
Appl. No. 18/013,205
Filed by Shimadzu Corporation, Kyoto (JP)
PCT Filed Dec. 7, 2020, PCT No. PCT/JP2020/045375
§ 371(c)(1), (2) Date Dec. 27, 2022,
PCT Pub. No. WO2022/004000, PCT Pub. Date Jan. 6, 2022.
Claims priority of application No. 2020-112575 (JP), filed on Jun. 30, 2020.
Prior Publication US 2023/0296541 A1, Sep. 21, 2023
Int. Cl. G01N 23/223 (2006.01)
CPC G01N 23/223 (2013.01) 9 Claims
OG exemplary drawing
 
1. An X-ray fluorescence analyzer comprising:
a sample chamber configured to place a sample therein;
a measurement chamber arranged adjacent to the sample in the sample chamber;
an X-ray tube configured to irradiate the sample with X-rays; and
a detector configured to detect X-rays reflected by the sample upon X-ray irradiation,
wherein a collimator is provided at a tip end of the detector, the collimator comprising
a window member,
a passage, having a tip end at a sample chamber side of the passage and a back end at a window member side of the passage, through which passage the X-rays reflected by the sample pass, the passage being positioned in the measurement chamber; and
a first hole, extending from a back end of the passage to an outside of the detector, connecting the passage to outside of the detector.