US 12,292,393 B2
X-ray phase imaging apparatus
Takahiro Doki, Kyoto (JP); Kenji Kimura, Kyoto (JP); Taro Shirai, Kyoto (JP); and Naoki Morimoto, Kyoto (JP)
Assigned to Shimadzu Corporation, Kyoto (JP)
Appl. No. 18/249,870
Filed by Shimadzu Corporation, Kyoto (JP)
PCT Filed Jul. 7, 2021, PCT No. PCT/JP2021/025645
§ 371(c)(1), (2) Date Apr. 20, 2023,
PCT Pub. No. WO2022/113416, PCT Pub. Date Jun. 2, 2022.
Claims priority of application No. 2020-195184 (JP), filed on Nov. 25, 2020.
Prior Publication US 2023/0384244 A1, Nov. 30, 2023
Int. Cl. G01N 23/041 (2018.01)
CPC G01N 23/041 (2018.02) [G01N 2223/401 (2013.01)] 11 Claims
OG exemplary drawing
 
1. An X-ray phase imaging apparatus comprising:
an X-ray source configured to irradiate a subject with X-rays;
an X-ray detector configured to detect the X-rays radiated from the X-ray source;
a plurality of gratings arranged between the X-ray source and the X-ray detector, and including a first grating to be irradiated with X-rays by the X-ray source and a second grating to be irradiated with the X-rays from the first grating;
a subject holder arranged in an X-ray irradiation area and configured to hold the subject;
an image processor configured to generate an X-ray phase contrast image including a dark-field image based on an intensity distribution of the X-rays detected by the X-ray detector; and
a first rotation mechanism including the subject holder, and configured to rotate the subject holder in a first rotating direction about a first axis that becomes collinear with an X-ray irradiation axis when the first rotation mechanism faces the X-ray source and passes through a center of the subject holder; wherein
the subject holder is formed of a first material having an X-ray transmittance greater than metal and an X-ray scattering degree smaller than the metal;
the first rotation mechanism is formed of the first material and includes a support member rotatably supporting the subject holder on one side of the support member; and
a thickness of the subject holder along the first axis is smaller than a thickness of the support member along the first axis.