US 12,291,536 B2
Crystal form of Wee1 inhibitor compound and use thereof
Wenyuan Qian, Shanghai (CN); Chundao Yang, Shanghai (CN); Zhengwei Li, Shanghai (CN); Jie Li, Shanghai (CN); Jian Li, Shanghai (CN); and Shuhui Chen, Shanghai (CN)
Assigned to Wuxi Biocity Biopharmaceutics Co., Ltd., Jiangsu (CN)
Appl. No. 17/607,447
Filed by Wuxi Biocity Biopharmaceutics Co., Ltd., Jiangsu (CN)
PCT Filed Apr. 30, 2020, PCT No. PCT/CN2020/088451
§ 371(c)(1), (2) Date Oct. 29, 2021,
PCT Pub. No. WO2020/221358, PCT Pub. Date Nov. 5, 2020.
Claims priority of application No. 201910364694.X (CN), filed on Apr. 30, 2019.
Prior Publication US 2022/0220120 A1, Jul. 14, 2022
Int. Cl. C07D 487/22 (2006.01)
CPC C07D 487/22 (2013.01) [C07B 2200/13 (2013.01)] 28 Claims
 
1. A crystal form of a compound of Formula (I):

OG Complex Work Unit Chemistry
selected from the group consisting of:
(1) Crystal Form A, wherein the Crystal Form A has an X-ray powder diffraction (XRPD) pattern having characteristic diffraction peaks at the following 2θ angles: 5.71±0.2°, 12.68±0.2° and 15.32±0.2° at Cu kα radiation with a wavelength of 1.54056 Å;
(2) Crystal Form B, wherein the Crystal Form B has an X-ray powder diffraction (XRPD) pattern having characteristic diffraction peaks at the following 2θ angles: 5.58±0.2°, 12.44±0.2° and 22.16±0.2° at Cu kα radiation with wavelength of 1.54056 Å;
(3) Crystal Form C, wherein the Crystal Form C has an X-ray powder diffraction (XRPD) pattern having characteristic diffraction peaks at the following 2θ angles: 5.05±0.2°, 5.58±0.2° and 12.44±0.2° Cu kα radiation with a wavelength of 1.54056 Å;
(4) Crystal Form D, wherein the Crystal Form D has an X-ray powder diffraction (XRPD) pattern having characteristic diffraction peaks at the following 2θ angles: 5.22±0.2°, 15.99±0.2° and 16.57±0.2° at Cu kα radiation with a wavelength of 1.54056 Å;
(5) Crystal Form E, wherein the Crystal Form E has an X-ray powder diffraction (XRPD) pattern having characteristic diffraction peaks at the following 2θ angles: 8.65±0.2°, 14.22±0.2° and 24.58±0.2° at Cu kα radiation with a wavelength of 1.54056 Å; and
(6) Crystal Form F, wherein the Crystal Form F has an X-ray powder diffraction (XRPD) pattern having characteristic diffraction peaks at the following 2θ angles: 5.06±0.2°, 15.91±0.2° and 16.68±0.2° at Cu kα radiation with a wavelength of 1.54056 Å.