US 12,291,503 B2
Crystalline form of compound, method for preparing the same, pharmaceutical composition and use
Xiaohua Sun, Beijing (CN); Long Wang, Beijing (CN); Hongzhen Yang, Beijing (CN); and Huaizhong Hu, Beijing (CN)
Assigned to Beijing Konruns Pharmaceutical Co., Ltd., Beijing (CN)
Appl. No. 17/604,745
Filed by Beijing Konruns Pharmaceutical Co., Ltd., Beijing (CN)
PCT Filed Apr. 20, 2020, PCT No. PCT/CN2020/085695
§ 371(c)(1), (2) Date Oct. 18, 2021,
PCT Pub. No. WO2020/216188, PCT Pub. Date Oct. 29, 2020.
Claims priority of application No. 201910324939.6 (CN), filed on Apr. 22, 2019.
Prior Publication US 2022/0259152 A1, Aug. 18, 2022
Int. Cl. C07D 215/22 (2006.01); A61P 35/02 (2006.01)
CPC C07D 215/22 (2013.01) [A61P 35/02 (2018.01); C07B 2200/13 (2013.01)] 15 Claims
 
1. A crystalline form of compound 1 selected from any one of crystal forms AB, M or F,

OG Complex Work Unit Chemistry
wherein an X-ray powder diffraction pattern of the crystalline form AB represented by an angle of 2θ has diffraction peaks at 4.6±0.1°, 6.7±0.1°, 10.7±0.1°, 16.2±0.1°, 17.0±0.1°, 17.4±0.1°, 19.5±0.1°, 20.7±0.1°, 21.9±0.1°, 22.5±0.1°, 23.8±0.1°, and 25.1±0.1°;
an X-ray powder diffraction pattern of the crystalline form M represented by an angle of 2θ has diffraction peaks at 9.5±0.1°, 10.2±0.1°, 10.6±0.1°, 11.4±0.1°, 13.2±0.1°, 14.3±0.1°, 18.2±0.1°, 18.9±0.1°, 19.3±0.1°, 19.7±0.1°, 20.4±0.1°, 23.3±0.1°, 26.7±0.1°, and 29.6±0.1°; and
an X-ray powder diffraction pattern of the crystalline form F represented by an angle of 2θ has diffraction peaks at 7.1±0.1°, 8.0±0.1°, 10.0±0.1°, 10.9±0.1°, 14.0±0.1°, 15.4±0.1°, 16.0±0.1°, 16.5±0.1°, 17.1±0.1°, 19.5±0.1°, 22.0±0.1°, 25.0±0.1°, and 28.1±0.1°.