| CPC C01B 32/956 (2017.08) [C01B 32/977 (2017.08); C04B 35/56 (2013.01); C04B 35/5603 (2013.01); C04B 35/571 (2013.01); C04B 35/80 (2013.01); C08G 77/20 (2013.01); C08G 77/50 (2013.01); C08L 83/00 (2013.01); C08L 83/04 (2013.01); C30B 23/00 (2013.01); C30B 23/025 (2013.01); C30B 29/06 (2013.01); C30B 29/36 (2013.01); H01L 21/02378 (2013.01); H01L 21/02381 (2013.01); H01L 21/02529 (2013.01); H01L 21/0262 (2013.01); H01L 29/1608 (2013.01); H01L 29/66068 (2013.01); H01L 29/66893 (2013.01); C04B 2235/3418 (2013.01); C04B 2235/3826 (2013.01); C04B 2235/44 (2013.01); C04B 2235/48 (2013.01); C04B 2235/483 (2013.01); C04B 2235/528 (2013.01); C04B 2235/5427 (2013.01); C04B 2235/5436 (2013.01); C04B 2235/6581 (2013.01); C04B 2235/72 (2013.01); C04B 2235/77 (2013.01); C04B 2235/96 (2013.01); C08G 77/12 (2013.01); C08G 77/80 (2013.01)] | 7 Claims |
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1. An SiC wafer having a 4 H or a 6H polytype, for use as a semiconductor, the SiC wafer comprising a polymer derived SiC and a filler;
a. wherein the SiC wafer is made by steps comprising:
i. vapor deposition of a polymer derived SiC material to form a boule; the polymer derived SiC material consisting essentially of the polymer derived SiC and the filler and having a purity of at least 99.999%; and,
ii. preparing a wafer from the boule; and,
b. wherein the polymer derived SiC material is made by steps comprising:
i. curing of a liquid SiOC precursor formulation to form a cured SiOC solid material;
ii. pyrolizing the SiOC solid material to form the polymer derived SiC material.
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