US 12,291,219 B2
Asynchronous in-system testing for autonomous systems and applications
Anitha Kalva, San Jose, CA (US); Jae Wu, Los Gatos, CA (US); Shantanu Sarangi, Saratoga, CA (US); Sailendra Chadalavada, Saratoga, CA (US); Milind Sonawane, Santa Clara, CA (US); Chen Fang, Shanghai (CN); and Abilash Nerallapally, Newark, CA (US)
Assigned to NVIDIA CORPORATION, Santa Clara, CA (US)
Filed by NVIDIA Corporation, Santa Clara, CA (US)
Filed on Oct. 24, 2022, as Appl. No. 18/048,952.
Prior Publication US 2024/0132083 A1, Apr. 25, 2024
Prior Publication US 2024/0227824 A9, Jul. 11, 2024
Int. Cl. B60W 50/02 (2012.01); B60W 50/00 (2006.01)
CPC B60W 50/0205 (2013.01) [B60W 2050/0044 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method comprising:
performing a first system test on a first processing element of an integrated processing system based at least on accessing, using a first local test controller, a first test node associated with the first processing element, the first local test controller being dedicated for the first test node and the first processing element; and
performing, independent of and at least partially during the first system test, a second system test on a second processing element of the integrated processing system based at least on accessing, using a second local test controller, a second test node associated with the second processing element, the second local test controller being dedicated for the second test node and the second processing element.