| CPC A61N 1/025 (2013.01) [A61N 1/08 (2013.01); A61N 1/36038 (2017.08); A61N 1/36142 (2013.01); G06F 11/0736 (2013.01); G06F 11/0751 (2013.01); G16H 40/40 (2018.01); G06F 2201/81 (2013.01)] | 23 Claims | 

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               1. A method, comprising: 
            determining, with an implantable component of a medical device, that the implantable component has experienced a safety critical fault, wherein the implantable component includes read-only memory (ROM) and non-volatile memory (NVM); 
                in response to determining that the medical device has experienced the safety critical fault, purposely corrupting, by the implantable component, a memory block of the non-volatile memory (NVM); and 
                automatically forcing the implantable component into a locked mode, 
                wherein the locked mode prevents execution of a run-time program stored in the implantable component. 
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