| CPC G01T 1/28 (2013.01) [G01T 1/20 (2013.01)] | 12 Claims |

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1. A method for manufacturing a detector for detecting the flows of a first and a second incident ionizing radiation that only differ from each other by the fact that the median energies of the ionizing particles in the first and second incident ionizing radiation are equal to a first and to a second value, respectively, with the second value differing from the first value by at least 500 keV, said method comprising:
acquiring the first and second values separated from each other by at least 500 keV; then
selecting a total thickness of amplifying material traversed when this detector is exposed to the first and second incident ionizing radiation, with this total thickness of amplifying material being able to generate a lower energy secondary ionizing radiation when it is excited by the first and second incident ionizing radiation, this total thickness being greater than 15 μm; then
producing a stack comprising, in the direction of propagation of the first and second incident ionizing radiation, the selected total thickness of amplifying material and a thickness of transducing material, with this thickness of transducing material being able to generate photons or electrical charges when it is excited by the secondary ionizing radiation generated by the total thickness of amplifying material;
connecting a sensor of photons or electrical charges to the produced stack in order to count the number of photons or electrical charges generated per second by the thickness of transducing material,
wherein selecting the total thickness of amplifying material comprises:
determining the abscissa em of a point of intersection between a first and a second curve, with the first and second curves representing the evolution of the number of photons or electrical charges generated per second by the transducing material as a function of the total thickness of amplifying material when the transducing material is irradiated, through this thickness of transducing material, by the first and second incident ionizing radiation, respectively; then
selecting the total thickness of amplifying material between 0.9 em and 1.1 em.
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