US 12,287,367 B2
Test board and test device including the same
Hyung Il Kim, Suwon-si (KR); Joo Sung Yun, Suwon-si (KR); Ki Jae Song, Suwon-si (KR); and Sang Do Han, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Gyeonggi-do (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Apr. 20, 2023, as Appl. No. 18/303,845.
Claims priority of application No. 10-2022-0073739 (KR), filed on Jun. 16, 2022.
Prior Publication US 2023/0408576 A1, Dec. 21, 2023
Int. Cl. G01R 31/28 (2006.01); G01R 1/04 (2006.01)
CPC G01R 31/2863 (2013.01) [G01R 1/0466 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A test board comprising:
a first region which includes a first upper surface with first test sockets aligned thereon, and a first lower surface opposite to the first upper surface;
a second region which includes a second upper surface with second test sockets aligned thereon, and a second lower surface opposite to the second upper surface;
a hinge portion between the first region and the second region, and configured to connect the first region and the second region such that the first region and the second region are folded or unfolded;
a first connector at one end of the first region opposite to the hinge portion; and
a second connector at one end of the second region opposite to the hinge portion.
 
12. A test board comprising:
a first region in which first test sockets are aligned;
a second region in which second test sockets are aligned;
a hinge portion between the first region and the second region, configured to change an angle between the first region and the second region, and configured to connect the first region and the second region;
a first connector at one end of the first region opposite to the hinge portion; and
a second connector at one end of the second region opposite to the hinge portion,
wherein the angle between the first region and the second region is 0 degree or more and 180 degrees or less,
the first connector is selectively connected to the second test sockets, and
the second connector is selectively connected to the first test sockets.
 
17. A test device comprising:
a main body which includes a chamber configured to test a plurality of test target devices; and
a test board configured to support the plurality of test target devices and mounted inside the chamber,
wherein the test board includes
a first region in which first test sockets connected to the test target devices are aligned,
a second region in which second test sockets connected to the test target devices are aligned,
a hinge portion between the first region and the second region, and configured to connect the first region and the second region such that the first region and the second region are folded or unfolded,
a first connector at one end of the first region opposite to the hinge portion, and
a second connector at one end of the second region opposite to the hinge portion.