US 12,287,287 B2
Pore measurement device
Niall O'Dowd, San Diego, CA (US); and Michael Todd, San Diego, CA (US)
Assigned to The Regents Of the University of California, Oakland, CA (US)
Appl. No. 17/775,530
Filed by The Regents of the University of California, Oakland, CA (US)
PCT Filed Nov. 12, 2020, PCT No. PCT/US2020/060291
§ 371(c)(1), (2) Date May 9, 2022,
PCT Pub. No. WO2021/097134, PCT Pub. Date May 20, 2021.
Claims priority of provisional application 63/092,285, filed on Oct. 15, 2020.
Claims priority of provisional application 63/045,699, filed on Jun. 29, 2020.
Claims priority of provisional application 62/934,885, filed on Nov. 13, 2019.
Prior Publication US 2022/0404276 A1, Dec. 22, 2022
Int. Cl. G01N 21/45 (2006.01); G01B 11/06 (2006.01); G01N 21/88 (2006.01)
CPC G01N 21/45 (2013.01) [G01B 11/0616 (2013.01); G01N 21/8806 (2013.01); G01N 2021/456 (2013.01); G01N 2021/8829 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A system comprising:
at least one processor; and
at least one memory including program code which when executed by the at least one processor causes operations comprising:
capturing an image of at least a portion of a surface of an object;
generating, from the captured image, pixel intensity data;
in response to generating the pixel intensity data, determining, based on a height error model, at least one height measurement of the object and height error data, wherein the height error data indicates an uncertainty of the at least one height measurement of the object; and
determining, based on the height error data, whether the object satisfies a threshold criteria for acceptance of the object, wherein determining whether the object satisfies the threshold criteria further comprises determining whether the object satisfies a threshold height.