US 12,287,194 B2
Motion mechanism for measuring probe
Isaiah Freerksen, Bothell, WA (US)
Assigned to Mitutoyo Corporation, Kanagawa-ken (JP)
Filed by Mitutoyo Corporation, Kanagawa-ken (JP)
Filed on Nov. 29, 2022, as Appl. No. 18/059,851.
Prior Publication US 2024/0175668 A1, May 30, 2024
Int. Cl. G01B 5/012 (2006.01)
CPC G01B 5/012 (2013.01) 25 Claims
OG exemplary drawing
 
1. A measuring system, comprising:
a measuring probe comprising:
a stylus having one or more contact portions that are configured to contact a workpiece to be measured;
at least one detection element configured to detect a movement of the stylus as corresponding to a contact of a contact portion of the stylus with a workpiece;
a signal processing portion configured to process a generated signal obtained from an output of the at least one detection element to output a measurement signal; and
a stylus motion mechanism, comprising:
a first motion portion configured to enable motion of the stylus from a rest position in a positive axial direction when a corresponding force in the positive axial direction is applied by a contact of a contact portion of the stylus with a workpiece, wherein the positive axial direction is toward a proximal end of the measuring probe; and
a second motion portion configured to enable motion of the stylus from the rest position in a negative axial direction when a corresponding force in the negative axial direction is applied by a contact of a contact portion of the stylus with a workpiece, wherein the negative axial direction is opposite to the positive axial direction.