US 12,284,456 B2
Imaging device and distance measurement system
Keishi Kumata, Kanagawa (JP)
Assigned to SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
Appl. No. 18/259,334
Filed by SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
PCT Filed Dec. 6, 2021, PCT No. PCT/JP2021/044739
§ 371(c)(1), (2) Date Jun. 26, 2023,
PCT Pub. No. WO2022/149388, PCT Pub. Date Jul. 14, 2022.
Claims priority of application No. 2021-000561 (JP), filed on Jan. 5, 2021.
Prior Publication US 2024/0314467 A1, Sep. 19, 2024
Int. Cl. H04N 25/772 (2023.01); H04N 23/56 (2023.01); H04N 23/667 (2023.01); H04N 25/705 (2023.01); H04N 25/76 (2023.01); H04N 25/767 (2023.01); H04N 25/779 (2023.01); H04N 25/78 (2023.01)
CPC H04N 25/772 (2023.01) [H04N 23/56 (2023.01); H04N 23/667 (2023.01); H04N 25/705 (2023.01); H04N 25/779 (2023.01); H04N 25/7795 (2023.01); H04N 25/78 (2023.01); H04N 25/767 (2023.01)] 17 Claims
OG exemplary drawing
 
1. An imaging device, comprising:
a photoelectric conversion element;
a signal converter that is boosted when charge transferred from the photoelectric conversion element is converted into a pixel signal;
a selection transistor that interrupts a signal line of the pixel signal during a boosting period of the signal converter;
a comparator including a non-inverting input terminal to which the pixel signal is input via the selection transistor, an inverting input terminal to which a ramp signal is input, and an output terminal which outputs a comparison result between the pixel signal and the ramp signal; and
a correction circuit that holds a potential of the non-inverting input terminal in the boosting period at a potential of the non-inverting input terminal before the boosting period.