US 12,283,921 B2
Methods and apparatus for driver calibration
Seiji Takeuchi, Hashima (JP)
Assigned to SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Scottsdale, AZ (US)
Filed by SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Scottsdale, AZ (US)
Filed on May 8, 2024, as Appl. No. 18/658,837.
Application 18/450,123 is a division of application No. 16/848,240, filed on Apr. 14, 2020, granted, now 11,770,105, issued on Sep. 26, 2023.
Application 18/658,837 is a continuation of application No. 18/450,123, filed on Aug. 15, 2023, granted, now 12,015,381.
Application 16/848,240 is a continuation of application No. 16/002,179, filed on Jun. 7, 2018, granted, now 10,658,986, issued on May 19, 2020.
Prior Publication US 2024/0291438 A1, Aug. 29, 2024
Int. Cl. H03F 1/30 (2006.01); G03B 13/36 (2021.01); G05F 3/24 (2006.01); H02P 25/034 (2016.01); H03F 3/45 (2006.01); H03M 1/10 (2006.01)
CPC H03F 1/30 (2013.01) [G03B 13/36 (2013.01); G05F 3/24 (2013.01); H02P 25/034 (2016.02); H03F 3/45 (2013.01); H03F 2200/453 (2013.01); H03M 1/1009 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a driver configured to, using a drive current, cause adjustment to a position of a lens;
a replica circuit configured to generate a replica current, wherein the replica current corresponds to the drive current;
a comparator configured to produce a comparison signal based on a comparison of the replica current and a threshold current; and
a controller configured to control the drive current based on a state of the comparison signal.