US 12,282,402 B2
Diagnostic baselining
Mark Theriot, McHenry, IL (US); Patrick S. Merg, Hollister, CA (US); Roy Steven Brozovich, Campbell, CA (US); and Bradley R. Lewis, Gilroy, CA (US)
Assigned to Snap-on Incorporated, Kenosha, WI (US)
Filed by Snap-on Incorporated, Kenosha, WI (US)
Filed on May 19, 2021, as Appl. No. 17/325,184.
Application 17/325,184 is a continuation of application No. 14/260,929, filed on Apr. 24, 2014, granted, now 11,048,604.
Application 14/260,929 is a continuation of application No. 13/031,565, filed on Feb. 21, 2011, abandoned.
Prior Publication US 2021/0279155 A1, Sep. 9, 2021
Int. Cl. G06F 11/30 (2006.01); G01M 17/00 (2006.01); G05B 23/02 (2006.01); G07C 5/08 (2006.01)
CPC G06F 11/30 (2013.01) [G01M 17/00 (2013.01); G05B 23/0281 (2013.01); G07C 5/0808 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
receiving, at a computing device, a diagnostic request to diagnose a device-under-service;
determining, at the computing device based on the diagnostic request, a first test, wherein the first test is defined to be performed while the device-under-service is operating in a first operating state of the device-under-service during a testing interval of time;
determining, at the computing device based on a communication received from the device-under-service, the device-under-service is operating in the first operating state;
transmitting, by the computing device to the device-under-service in response to the computing device determining the device-under-service is operating in the first operating state based on the communication received from the device-under-service, one or more messages arranged according to an on-board diagnostic protocol to control operation of a component on board the device-under-service as part of performing the first test one or more times during the testing interval of time while the device-under-service is operating in the first operating state;
receiving, at the computing device, first data related to the device-under-service based on performance of the first test at the first operating state of the device-under-service one or more times during the testing interval of time, wherein the first data is indicative of two or more measurements;
classifying, at the computing device, the first data related to the device-under-service as first operating-state data based on reliability of the first data related to the device-under-service and verification of the first data related to the device-under-service being related to the first operating state and the testing interval of time;
generating, at the computing device, a differential analysis based on the first operating-state data,
generating, at the computing device, a report display by the device based on the differential analysis, and
sending, by the computing device, the report display, wherein the report display includes one or more sub-strategies including an additional test to perform on the device-under-service during diagnosis and repair of the device-under-service to address a complaint.