US 12,282,147 B2
Method and system for enhanced photon microscopy
Weidong Yang, Penn Valley, PA (US); and Andrew Ruba, Philadelphia, PA (US)
Assigned to Temple University-Of The Commonwealth System of Higher Education, Philadelphia, PA (US)
Appl. No. 17/780,044
Filed by Temple University-Of The Commonwealth System of Higher Education, Philadelphia, PA (US)
PCT Filed Nov. 25, 2020, PCT No. PCT/US2020/062152
§ 371(c)(1), (2) Date May 26, 2022,
PCT Pub. No. WO2021/108493, PCT Pub. Date Jun. 3, 2021.
Claims priority of provisional application 62/941,118, filed on Nov. 27, 2019.
Prior Publication US 2023/0011994 A1, Jan. 12, 2023
Int. Cl. G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/08 (2006.01); G02B 21/16 (2006.01)
CPC G02B 21/361 (2013.01) [G01N 21/6458 (2013.01); G02B 21/08 (2013.01); G02B 21/16 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A photon enhancement apparatus, comprising:
a housing having first and second ends;
first and second lenses having a same focal length, positioned concentrically within the housing separated by a distance equal to 2× the focal length;
a reflective component positioned at the second end of the housing at a distance of one focal length from the second lens; and
an imaging platform having at least one transparent region configured to hold a sample, positioned in optical communication with the housing, at a distance of one focal length from the first lens.