US 12,282,081 B2
Methods and systems for diagnosing magnetic sensors
Harish Kumar, Frisco, TX (US); and Srinivasan Venkataraman, Irving, TX (US)
Assigned to Texas Instruments Incorporated, Dallas, TX (US)
Filed by Texas Instruments Incorporated, Dallas, TX (US)
Filed on Jan. 25, 2023, as Appl. No. 18/159,221.
Application 18/159,221 is a division of application No. 17/161,009, filed on Jan. 28, 2021, granted, now 11,592,511.
Claims priority of provisional application 63/030,601, filed on May 27, 2020.
Prior Publication US 2023/0160990 A1, May 25, 2023
Int. Cl. G01R 33/00 (2006.01); G01R 33/07 (2006.01); G01R 35/00 (2006.01)
CPC G01R 35/00 (2013.01) [G01R 33/0023 (2013.01); G01R 33/07 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A circuit comprising:
a magnetic sensor having a first sensor terminal, a second sensor terminal, a third sensor terminal, and a fourth sensor terminal;
a diagnostic sensor having a first diagnostic terminal, a second diagnostic terminal, a third diagnostic terminal, and a fourth diagnostic terminal;
a first multiplexer coupled to the first sensor terminal and to the first diagnostic terminal;
a second multiplexer coupled to the second sensor terminal and to the second diagnostic terminal; and
a third multiplexer coupled to the third sensor terminal, to the fourth sensor terminal, to the first diagnostic terminal, to the second diagnostic terminal, to the third diagnostic terminal, and to the fourth diagnostic terminal, the third multiplexer having a first differential output terminal and a second differential output terminal.