US 12,282,041 B1
Non-contact circuit testing systems and methods
Mark Bates, Lansdale, PA (US); James Edelen, Lansdale, PA (US); Robert Bauerle, Lansdale, PA (US); Michael Robert Ladd, Souderton, PA (US); and David L. Barrett, Lansdale, PA (US)
Assigned to Cobham Advanced Electronic Solutions Inc., Arlington, VA (US)
Filed by Cobham Advanced Electronic Solutions Inc., Arlington, VA (US)
Filed on Oct. 10, 2022, as Appl. No. 18/045,295.
Int. Cl. G01R 1/07 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01)
CPC G01R 1/07 (2013.01) [G01R 31/2812 (2013.01); G01R 1/067 (2013.01); G01R 31/281 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A non-contact circuit testing apparatus comprising:
a circuit cover comprising a conductive material, wherein the circuit cover is configured to form a parallel plate capacitor with an electrical component of a circuit board; and
an oscilloscope probe configured to measure a voltage across a gap of the parallel plate capacitor by placing the oscilloscope probe above the circuit cover.