US 11,959,963 B2
Integrity tests for mixed analog digital systems
Olaf Donner, Harsum (DE); and Tammo Kunnert, Hildesheim (DE)
Assigned to Aptiv Technologies AG, Schaffhausen (CH)
Filed by Aptiv Technologies AG, Schaffhausen (CH)
Filed on Dec. 12, 2022, as Appl. No. 18/064,499.
Claims priority of provisional application 63/268,055, filed on Feb. 15, 2022.
Claims priority of application No. 22161941 (EP), filed on Mar. 14, 2022.
Prior Publication US 2023/0258712 A1, Aug. 17, 2023
Int. Cl. G01R 31/316 (2006.01); G01R 31/00 (2006.01); G01R 31/3167 (2006.01)
CPC G01R 31/3167 (2013.01) [G01R 31/007 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A vehicle system comprising:
a device under test comprising:
a source configured to produce a digital transmission;
a first test signal generator (TSG) configured to:
produce a first test signal based on a test generation function; and
inject the first test signal into the digital transmission;
a digital path configured to transfer the digital transmission from the first TSG to an analog output of the device under test; and
the analog output configured to output an analog response along an analog path based on the digital transmission; and
a test device comprising:
at least one processor configured to:
receive, from the device under test, the analog response;
receive, from a second TSG of the test device, a second test signal based on the test generation function;
compensate the second test signal using a linear transfer function of a combination of the digital path and the analog path of the device under test to produce an estimated test signal;
determine whether the estimated test signal is identifiable from the analog response; and
output an indication of whether any errors have been introduced by the digital path of the device under test based on whether the estimated test signal is identifiable from the analog response.