US 12,279,035 B2
Inspection device, blister packaging machine, and method for manufacturing blister pack
Yukihiro Taguchi, Aichi (JP); and Shozo Oda, Aichi (JP)
Assigned to CKD CORPORATION, Aichi (JP)
Filed by CKD CORPORATION, Aichi (JP)
Filed on Oct. 5, 2023, as Appl. No. 18/377,258.
Application 18/377,258 is a continuation of application No. PCT/JP2021/043103, filed on Nov. 25, 2021.
Claims priority of application No. 2021-065178 (JP), filed on Apr. 7, 2021.
Prior Publication US 2024/0040230 A1, Feb. 1, 2024
Int. Cl. G01J 5/08 (2022.01); B65B 7/28 (2006.01); B65B 11/52 (2006.01); B65B 43/08 (2006.01); B65B 57/00 (2006.01); B65B 61/04 (2006.01); G01N 21/95 (2006.01); G06T 7/00 (2017.01); H04N 23/58 (2023.01); G02B 27/00 (2006.01)
CPC H04N 23/58 (2023.01) [B65B 7/28 (2013.01); B65B 11/52 (2013.01); B65B 43/08 (2013.01); B65B 57/00 (2013.01); B65B 61/04 (2013.01); G06T 7/0004 (2013.01); B65B 2230/02 (2013.01); G02B 27/0025 (2013.01); G06T 2207/30108 (2013.01)] 18 Claims
OG exemplary drawing
 
1. An inspection device, comprising:
an illumination device that irradiates a conveyed inspection object with predetermined light;
an imaging device that comprises:
an optical system that corrects a field curvature in the optical system;
an imaging element that takes an image of the inspection object via the optical system to obtain image data; and
a mirror that reflects an incident light from the inspection object, toward the optical system; and
an inspection controller that:
judges whether a quality of the inspection object is good or poor based on the image data; and
controls the imaging device by executing:
a first imaging process of causing the imaging device to take an image of a first inspection area of the inspection object at a first timing when the first inspection area is located within a first focusing range of the imaging device, wherein the first inspection area is focusable within the first focusing range without the mirror; and
a second imaging process of causing the imaging device to take an image of a second inspection area of the inspection object at a second timing when the second inspection area is located within a second focusing range of the imaging device, wherein the second inspection area is out of the first focusing range in the first imaging process and is focusable within the second focusing range via the mirror.