US 12,279,026 B2
Imaging device
Kazuhiro Yamada, Osaka (JP); Yosuke Asai, Osaka (JP); and Hiroshi Yamaguchi, Osaka (JP)
Assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka (JP)
Filed by Panasonic Intellectual Property Management Co., Ltd., Osaka (JP)
Filed on Mar. 29, 2022, as Appl. No. 17/707,331.
Application 17/707,331 is a continuation of application No. PCT/JP2020/024787, filed on Jun. 24, 2020.
Claims priority of application No. 2019-185627 (JP), filed on Oct. 9, 2019.
Prior Publication US 2022/0224845 A1, Jul. 14, 2022
Int. Cl. G01N 21/3581 (2014.01); H04N 23/11 (2023.01)
CPC H04N 23/11 (2023.01) [G01N 21/3581 (2013.01)] 12 Claims
OG exemplary drawing
 
1. An imaging device comprising:
a first light source including a first emission surface from which a sub-terahertz wave is emitted to a measurement target; and
a first detector including a first image sensor that detects an intensity of a reflected wave generated by the measurement target specularly reflecting the sub-terahertz wave emitted from the first emission surface, wherein
the first light source includes:
at least one point light source that emits a sub-terahertz wave; and
an optical element serving as an area light source that emits a sub-terahertz wave from the first emission surface by diffusing, at a micro level, the sub-terahertz wave emitted from the at least one point light source, and that illuminates a same measurement position on the measurement target with the sub-terahertz wave from various angles,
the imaging device further comprises:
a second light source including a second emission surface from which a sub-terahertz wave is emitted to the measurement target, the second emission surface being located at a position different from a position of the first emission surface; and
a second detector including a second image sensor that detects an intensity of a reflected wave generated by the measurement target specularly reflecting the sub-terahertz wave emitted from the first emission surface and the sub-terahertz wave emitted from the second emission surface and the sub-terahertz wave emitted from the second emission surface,
the first emission surface emits the sub-terahertz wave from a first direction and the second emission surface emits the sub-terahertz wave from a second direction different from the first direction, and
the first detector receives, from the first direction, the reflected wave generated by the measurement target specularly reflecting the sub-terahertz wave, and the second detector receives, from the second direction, the reflected wave generated by the measurement target specularly reflecting the sub-terahertz wave.