US 12,277,694 B2
Method of detecting defect and system of detecting defect
Younggil Park, Asan-si (KR); Kihyun Kim, Hwaseong-si (KR); and Younguook Lee, Cheonan-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do (KR)
Filed by Samsung Display Co., Ltd., Yongin-Si (KR)
Filed on May 20, 2021, as Appl. No. 17/325,396.
Claims priority of application No. 10-2020-0108417 (KR), filed on Aug. 27, 2020.
Prior Publication US 2022/0067910 A1, Mar. 3, 2022
Int. Cl. G06T 7/00 (2017.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06T 7/70 (2017.01)
CPC G06T 7/0004 (2013.01) [G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 7/70 (2017.01); G06T 2207/10061 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A method of detecting a defect in a stacked structure of a display panel, the method comprising:
collecting a first image of the defect and a plurality of layers in the stacked structure in a cross-section from a database;
learning a defect information of the defect and a layer information of the plurality of layers using a deep learning model based on the first image; and
detecting a location of the defect among the plurality of layers by the defect information and the layer information,
wherein the defect information includes a component information of the defect,
the layer information includes a component information of the plurality of layers, and
the component information of the defect and the component information of the plurality of layers each exhibit a predetermined color.