US 12,276,773 B2
Method for manufacturing optical lens provided with anti-reflection film
Yoshihiro Nakano, Tondabaya (JP); and Koji Takahara, Hirakata (JP)
Assigned to Konica Minolta, Inc., Tokyo (JP)
Appl. No. 17/779,127
Filed by Konica Minolta, Inc., Tokyo (JP)
PCT Filed Oct. 29, 2020, PCT No. PCT/JP2020/040635
§ 371(c)(1), (2) Date May 24, 2022,
PCT Pub. No. WO2021/131316, PCT Pub. Date Jul. 1, 2021.
Claims priority of application No. 2019-234863 (JP), filed on Dec. 25, 2019.
Prior Publication US 2022/0413186 A1, Dec. 29, 2022
Int. Cl. G02B 1/115 (2015.01); C23C 14/06 (2006.01); C23C 14/10 (2006.01)
CPC G02B 1/115 (2013.01) [C23C 14/0694 (2013.01); C23C 14/10 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for manufacturing an optical lens using an ion-assisted deposition apparatus that comprises an ion source, the method comprising:
forming, on a lens substrate made of a material containing 40 mass % or more of fluoride, a first lower layer of an anti-reflection film of the optical lens, wherein the first lower layer is a fluoride layer;
forming, on the first lower layer, a second lower layer of the anti-reflection film;
forming, on the second lower layer, one or more intermediate layers of the anti-reflection film;
forming, on the one or more intermediate layers, an uppermost layer of the anti-reflection film; and
irradiating, using the ion source, the lens substrate with ions such that:
a first energy and a first amount per unit time of the ions reaching the first lower layer and at least a lower half of the second lower layer, while forming the first lower layer and at least the lower half of the second lower layer, are respectively smaller than a second energy and a second amount per unit time of the ions reaching the one or more intermediate layers while forming the one or more intermediate layers, and
the lower half of the second lower layer is a portion of the second lower layer that is on a side of the first lower layer with respect to a center of the second lower layer in a thickness direction of the second lower layer.