US 12,276,677 B1
Waveguide alignment system with dual plates
Dhanraj Vikram Doshi, Torrance, CA (US); and Yonghui Shu, Rolling Hills Estates, CA (US)
Assigned to SAGE Millimeter, Inc., Torrance, CA (US)
Filed by SAGE Millimeter, Inc., Torrance, CA (US)
Filed on Jul. 11, 2022, as Appl. No. 17/862,060.
Claims priority of provisional application 63/322,422, filed on Mar. 22, 2022.
Int. Cl. H04B 3/46 (2015.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01); H01P 3/12 (2006.01)
CPC G01R 1/0416 (2013.01) [G01R 31/2822 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A waveguide alignment system, comprising:
a base component, wherein the base component includes a rail;
a lower plate coupled to the base component; and
an upper plate coupled to the lower plate, wherein the upper plate is configured to attach to an electronic testing equipment component,
wherein the electronic testing equipment component is coupled to a waveguide component comprising one or more alignment pins that are configured to engage a device under test.