CPC H01L 21/02579 (2013.01) [C23C 16/301 (2013.01); C30B 25/14 (2013.01); C30B 29/42 (2013.01); H01L 21/02546 (2013.01); H01L 21/02576 (2013.01); H01L 21/0262 (2013.01); H01L 29/06 (2013.01)] | 24 Claims |
1. A vapor phase epitaxy method comprising:
growing a III-V layer on a substrate in a reaction chamber from a vapor phase from an epitaxial gas flow comprising a carrier gas, at least one first precursor for Galium, and at least one second precursor for an Arsine compound;
during said growing, setting, when a first growth height of the Ill-V layer is reached, a first initial doping level via a ratio of a first mass flow of the first precursor to a second mass flow of the second precursor in the epitaxial gas flow;
during said growing, changing, stepwise or continuously, the ratio of the first mass flow of the first precursor to the second mass flow of the second precursor; and
during said growing, increasing, stepwise or continuously, a mass flow of a third Silane precursor for an n-type dopant in the epitaxial gas flow, doping of the III-V layer with a growth height of at least 10 μm being changed until a target n-doping level of at most 5·1016 cm−3 is reached.
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