US 11,953,519 B2
Modular automated test system
Christopher James Bruno, North Reading, MA (US); Philip Luke Campbell, North Reading, MA (US); Adnan Khalid, North Reading, MA (US); Evgeny Polyakov, North Reading, MA (US); and John Patrick Toscano, North Reading, MA (US)
Assigned to TERADYNE, INC., North Reading, MA (US)
Filed by Teradyne, Inc., North Reading, MA (US)
Filed on Oct. 22, 2020, as Appl. No. 17/077,834.
Prior Publication US 2022/0128598 A1, Apr. 28, 2022
Int. Cl. G01R 31/28 (2006.01); G01R 1/04 (2006.01)
CPC G01R 1/0458 (2013.01) [G01R 1/045 (2013.01); G01R 31/2893 (2013.01)] 28 Claims
OG exemplary drawing
 
1. A test system comprising:
packs, each pack comprising:
test sockets for testing devices under test (DUTs); and
at least some test electronics for performing tests on the DUTs in the test sockets, the test electronics being different from the DUTs;
where the at least some test electronics comprises at least one of: pin electronics, a parametric measurement unit, logic circuitry, or a processing device, and
where different packs are configured to have different configurations, the different configurations comprising at least different numbers of test sockets arranged at different pitches.