US 11,953,518 B2
Switching matrix system and operating method thereof for semiconductor characteristic measurement
Choon Leong Lou, Hsinchu (TW); Hsiao Hui Hsieh, Hsinchu (TW); and Li Min Wang, Hsinchu (TW)
Assigned to STAR TECHNOLOGIES, INC., Hsinchu (TW)
Filed by STAR TECHNOLOGIES, INC., Hsinchu (TW)
Filed on Dec. 30, 2020, as Appl. No. 17/137,808.
Prior Publication US 2022/0206040 A1, Jun. 30, 2022
Int. Cl. G01R 1/02 (2006.01); G01R 31/26 (2020.01); G06N 3/045 (2023.01)
CPC G01R 1/025 (2013.01) [G01R 31/2601 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A switching matrix system for semiconductor characteristic measurement, comprising:
a plurality of slots configured for receiving at least one switching matrix module;
a controller, electrically connected to the slots; and
a storage unit, electrically connected to the controller for storing a program that, when executed, causes the controller to:
detect an assembly of the at least one switching matrix module inserted into the slots;
determine a user interface according to the assembly of the at least one switching matrix module inserted into the slots, wherein the user interface includes at least one operable object corresponding to the assembly; and
provide the user interface.