US 12,273,612 B1
Test system
Yuhei Hayashi, Moriyama (JP); and Jun Mitsudo, Moriyama (JP)
Assigned to Leimac Ltd., Moriyama (JP)
Appl. No. 18/858,729
Filed by Leimac Ltd., Moriyama (JP)
PCT Filed Nov. 18, 2022, PCT No. PCT/JP2022/042925
§ 371(c)(1), (2) Date Oct. 21, 2024,
PCT Pub. No. WO2023/238424, PCT Pub. Date Dec. 14, 2023.
Claims priority of application No. 2022-093359 (JP), filed on Jun. 8, 2022.
Int. Cl. H04N 23/56 (2023.01); G01N 21/88 (2006.01); H04N 23/95 (2023.01)
CPC H04N 23/56 (2023.01) [H04N 23/95 (2023.01); G01N 2021/8838 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A test system, comprising:
a lighting apparatus which includes a plurality of light-emitting elements, and which emits light from the plurality of light-emitting elements so as to light a product that is to be inspected;
a lighting controller which divides the plurality of light-emitting elements into N number of areas with N being a natural number that is 2 or more, and which sequentially supplies current to each of the N number of areas so as to emit light in each lighting period;
a camera which sequentially captures images of the product in an image-capturing period synchronized with the lighting period;
a test system control device;
a first wiring cable which supplies DC power from the camera to the lighting controller or from the lighting controller to the camera; and
a second wiring cable which supplies DC power from the test system control device to the camera or from the test system control device to the lighting controller, wherein
N number of images captured by the camera are reconstructed to one inspection image in the test system control device or in the camera, through inter-image calculation, or through inter-image calculation and inter-pixel calculation.