| CPC H01Q 1/48 (2013.01) | 9 Claims |

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1. A method comprising:
forming a device layer on a first side of a semiconductor substrate;
forming a through-silicon-via (TSV) passing through the semiconductor substrate;
depositing a first portion and a second portion of an antenna structure onto a second side of the semiconductor substrate opposite the first side, wherein the TSV joins to the first portion of the antenna structure;
electrically coupling the first portion and the second portion of the antenna structure; and
severing an electrical connection between two of the portions of the antenna structure to tune the antenna structure for use with a transmission device.
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