| CPC H01L 25/50 (2013.01) [H01L 21/486 (2013.01); H01L 21/563 (2013.01); H01L 21/76224 (2013.01); H01L 23/3128 (2013.01); H01L 23/49833 (2013.01); H01L 23/49861 (2013.01); H01L 24/05 (2013.01); H01L 24/13 (2013.01); H01L 2224/02333 (2013.01)] | 6 Claims |

|
1. A semiconductor package structure, comprising:
an electrical connection member comprising a reinforcing layer and a conductive pillar passing through the reinforcing layer;
an encapsulant encapsulating the electrical connection member;
a redistribution layer disposed over the conductive pillar;
a plurality of electronic components disposed over the redistribution layer;
wherein the conductive pillar has a first pillar portion and a second pillar portion, and wherein the second pillar portion is disposed under the redistribution layer and a lateral surface of the second pillar portion is covered by the encapsulant, and the first pillar portion is in direct contact with the second pillar portion and a lateral surface of the first pillar portion is covered by the reinforcing layer, and a height of the second pillar portion is greater than a height of the first pillar portion;
wherein the plurality of the electronic components comprise a first electronic component and a second component, and the first electronic component has a first surface facing the redistribution layer and the second electronic component has a second surface facing the redistribution layer, and wherein the first surface is not level with the second surface;
wherein the first electronic component has a first electrical contactor protruded beyond the first surface of the first electronic component and located over a pad of the redistribution layer, a center of the first electrical contactor of the first electronic component and a center of the pad of the redistribution layer are misaligned with each other in a cross-sectional view.
|