| CPC H01F 27/2804 (2013.01) [H01F 1/04 (2013.01); H01F 27/40 (2013.01); H05K 1/165 (2013.01)] | 21 Claims |

|
1. An apparatus, comprising:
a plurality of metallization levels with one or more layers of dielectric material between the levels, wherein each of the metallization levels comprises a plurality of coplanar metallization traces;
a first high-permeability magnetic ferrite element within the dielectric material, the first high-permeability magnetic ferrite element in direct contact with a first surface of a coiled one of the metallization traces in a first of the metallization levels; and
a second high-permeability magnetic ferrite element within the dielectric material, the second high-permeability magnetic ferrite element in direct contact with a second surface of the coiled one of the metallization traces, opposite the first surface, and in direct contact with a portion of the first high-permeability magnetic ferrite element extending between turns of the coiled one of the metallization traces.
|