US 12,271,712 B2
Providing metric data for patterns usable in a modeling environment
Huanhuan Xu, Wellesley, MA (US); Partha Biswas, Wayland, MA (US); Madhav Rajan, Brighton, MA (US); Sherman Braganza, Brookline, MA (US); Chirag Gupta, Karnataka (IN); Neha Pal, Midnapore (IN); and Radhey Shyam Meena, Samred Kalan (IN)
Assigned to The MathWorks, Inc., Natick, MA (US)
Filed by The MathWorks, Inc., Natick, MA (US)
Filed on Aug. 29, 2023, as Appl. No. 18/457,678.
Application 18/457,678 is a division of application No. 17/374,806, filed on Jul. 13, 2021, granted, now 11,782,682.
Prior Publication US 2023/0409296 A1, Dec. 21, 2023
Int. Cl. G06F 8/36 (2018.01); G06F 8/10 (2018.01); G06F 8/77 (2018.01)
CPC G06F 8/36 (2013.01) [G06F 8/10 (2013.01); G06F 8/77 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method, comprising:
for each pattern of two or more patterns, the pattern comprising at least two blocks and representing one or more computations being executable in a modeling environment, the one or more computations being associated with operation or behavior of a real-world system:
constructing, using one or more processors, one or more contexts for generating metric data for the pattern, the one or more contexts comprising parameters for analyzing or executing a pattern, the metric data being associated with one or more objectives with which the use of the pattern is associated, the one or more objectives comprising computer memory usage, execution efficiency, and/or execution performance;
generating, for each context in the one or more contexts, code for the pattern;
generating, by the one or more processors, for the pattern and under each context, metric data, the metric data comprising:
computer memory usage data, complexity data, and/or compliance violation data; and
model metrics which are independent of a target platform, the generating comprising executing or analyzing the code;
associating the metric data of the pattern under each context with the one or more objectives; and
storing the metric data and the association for use in providing information about the metric data or information based on the metric data when the pattern is to be used or is used in a model representing the real-world system.