US 12,269,206 B2
Optical scanning for industrial metrology
Wojciech Matusik, Lexington, MA (US); Gregory Ellson, Cambridge, MA (US); Desai Chen, Arlington, MA (US); Javier Ramos, Boston, MA (US); Davide Marini, Medford, MA (US); and Aaron Weber, Arlington, MA (US)
Assigned to Inkbit, LLC, Medford, MA (US)
Filed by Inkbit, LLC, Medford, MA (US)
Filed on May 4, 2021, as Appl. No. 17/307,521.
Application 17/307,521 is a division of application No. 16/671,234, filed on Nov. 1, 2019, granted, now 10,994,477.
Prior Publication US 2021/0394436 A1, Dec. 23, 2021
This patent is subject to a terminal disclaimer.
Int. Cl. B29C 64/135 (2017.01); B29C 64/205 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 70/00 (2020.01); G02B 26/10 (2006.01)
CPC B29C 64/135 (2017.08) [B29C 64/205 (2017.08); B29K 2995/0027 (2013.01); B29K 2995/0035 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 70/00 (2014.12); G02B 26/10 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A method for additive manufacturing, said method comprising:
forming an object, wherein forming said object comprises depositing fabrication material comprising a build material and a fluorescent material that fluoresces in response to illumination by radiation having a first wavelength;
carrying out profilometry, wherein carrying out said profilometry comprises illuminating said object with radiation at a first wavelength, sensing fluorescence that results from said illumination, and determining a geometric property of said object based on said fluorescence; and
initiating curing of said material, including illuminating said material with radiation at a second wavelength;
wherein the method further comprises depositing a support material around a partial formation of the object and detecting a transition between the fabrication material and the support material as a result of a difference between the optical properties of the fabrication material and those of the support material.