US 11,950,118 B2
Modular test and measurement device
Craig Stephen Boledovic, Walkersville, MD (US); Maxime Gatti, Saint Etienne (FR); and Andrew Thomas Rayno, Frederick, MD (US)
Assigned to VIAVI SOLUTIONS INC., Chandler, AZ (US)
Filed by VIAVI SOLUTIONS INC., Chandler, AZ (US)
Filed on Feb. 3, 2023, as Appl. No. 18/105,326.
Application 18/105,326 is a continuation of application No. 16/938,668, filed on Jul. 24, 2020, granted, now 11,601,829.
Prior Publication US 2023/0189028 A1, Jun. 15, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. H04W 24/08 (2009.01); H04M 1/24 (2006.01); H04W 88/06 (2009.01)
CPC H04W 24/08 (2013.01) [H04M 1/24 (2013.01); H04W 88/06 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A test instrument, comprising:
a modular display unit comprising a display element to display results and a display connector;
a modular processing unit comprising a processor, a first processing-unit connector, and a second processing-unit connector;
a modular test unit to facilitate performance of tests or measurements, comprising a test-unit interface, a first test-unit connector, and a second test-unit connector, wherein the first test-unit connector is to be coupled to the first processing-unit connector or the display connector; and
a modular test subunit to perform additional tests or additional measurements, comprising a first test-subunit connector to be coupled to the second processing-unit connector.