CPC H01L 23/562 (2013.01) [H01L 23/043 (2013.01); H01L 23/13 (2013.01); H01L 23/3135 (2013.01); H01L 23/49816 (2013.01); H01L 23/49838 (2013.01); H01L 23/5383 (2013.01); H01L 24/16 (2013.01); H01L 25/0655 (2013.01); H01L 23/5385 (2013.01); H01L 2224/16227 (2013.01)] | 9 Claims |
1. A semiconductor package structure, comprising:
a substrate having a wiring structure;
a first semiconductor die disposed over the substrate and electrically coupled to the wiring structure;
a second semiconductor die disposed over the substrate and electrically coupled to the wiring structure, wherein the first semiconductor die and the second semiconductor die are arranged side-by-side;
holes formed on a surface of the substrate, wherein the holes are located within a projection of the first semiconductor die or the second semiconductor die on the substrate; and
a molding material, surrounding the first semiconductor die and the second semiconductor die, and surfaces of the first semiconductor die and the second semiconductor die facing away from the substrate are exposed by the molding material.
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