US 11,948,650 B2
Testing circuit, testing device and testing method thereof
Liang Zhang, Shanghai (CN)
Assigned to CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei (CN)
Filed by CHANGXIN MEMORY TECHNOLOGIES, INC., Anhui (CN)
Filed on Nov. 6, 2021, as Appl. No. 17/453,846.
Application 17/453,846 is a continuation of application No. PCT/CN2021/100887, filed on Jun. 18, 2021.
Claims priority of application No. 202010892968.5 (CN), filed on Aug. 31, 2020.
Prior Publication US 2022/0068416 A1, Mar. 3, 2022
Int. Cl. G11C 29/10 (2006.01); G01R 29/02 (2006.01); G11C 7/10 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/36 (2006.01); G11C 29/46 (2006.01)
CPC G11C 29/10 (2013.01) [G01R 29/023 (2013.01); G11C 7/106 (2013.01); G11C 7/1087 (2013.01); G11C 29/023 (2013.01); G11C 29/12015 (2013.01); G11C 29/36 (2013.01); G11C 29/46 (2013.01); G11C 2029/3602 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A testing circuit, comprising:
a first sampling module, configured to receive a to-be-tested pulse signal, and generate a first sampled signal according to the to-be-tested pulse signal; and
a second sampling module, configured to receive the to-be-tested pulse signal, and generate a second sampled signal according to the to-be-tested pulse signal,
wherein the second sampled signal and the first sampled signal have a phase difference, the phase difference being equal to a pulse width of the to-be-tested pulse signal,
wherein the first sampling module comprises:
a first temporary storage unit, configured to sample a first to-be-sampled signal in response to the to-be-tested pulse signal so as to generate a first temporary storage signal, wherein a triggering type of the first temporary storage unit is edge triggering, and an edge of the first temporary storage signal corresponds to a first edge of the to-be-tested pulse signal and corresponds to an edge of the first sampled signal; and
wherein the second sampling module comprises a transmission gate and a second temporary storage unit.